Protective Effect of Rutin on Cognition Impairment Caused by Sodium Valproate

Shagun Upadhyay *

Department of Pharmacology, ITM, Gorakhpur, India.

Deepa Shukla

AIG Hospitals, Hyderabad, India.

Akanksha Awasthi

Department of Pharmacology, BBD College of Dental Sciences, Lucknow, India.

Joycee Jogi

College of Veterinary Sciences and Animal Husbandry, Mhow, India.

Poonam Shakya

College of Veterinary Sciences and Animal Husbandry, Jabalpur, India.

Yogita Pandey

College of Veterinary Sciences and Animal Husbandry, Mhow, India.

*Author to whom correspondence should be addressed.


Abstract

Introduction: The goal is to compare the effects of sod valproate and rutin vs sod valproate and piracetam on seizure control, cognitive function, and motor function in mice.

Methods: A technique called increasing current electroshock seizure (ICES) was used to assess how sod valproate and piracetam together affected convulsions. While motor abilities were screened utilizing rolling roller apparatus and counting the number of arm entries on a plus maze, cognitive functions were evaluated by observing spontaneous behavioral alternation on a plus maze. The Ellman et al. method was used to evaluate the activity of brain acetylcholinesterase (AChE).

Results: Without affecting sod valproate's ability to prevent ICES in both acute and long-term trials, the study demonstrated that rutin, when taken in conjunction with sod valproate, dramatically reversed the phenytoin-induced decrease in spontaneous alternation. Additionally, it counteracted the rise in AChE activity brought on by sod valproate.

Conclusion: Without compromising its antiepileptic properties, rutin reduced the cognitive damage caused by sod valproate.

Keywords: Acetylcholinesterase, cognitive functions, sodium valproate, rutin


How to Cite

Upadhyay, Shagun, Deepa Shukla, Akanksha Awasthi, Joycee Jogi, Poonam Shakya, and Yogita Pandey. 2025. “Protective Effect of Rutin on Cognition Impairment Caused by Sodium Valproate”. Journal of Advances in Biology & Biotechnology 28 (4):448-55. https://doi.org/10.9734/jabb/2025/v28i42204.

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